专利名称:ELECTRICAL RESISTANCE FOR THE
MEASUREMENT OF PREFERABLY HIGHFREQUENCY ALTERNATING CURRENTS
发明人:TEPPAN, WOLFRAM申请号:EP02726971.1申请日:20020104公开号:EP1348132A1公开日:20031001
摘要:The present invention relates to measuring resistance value (1), especiallymeasure high frequency alternating current, voltage measured by electric currentmeasured by input with connector (2,3) and connector (4,5) and the layer for tapconstruct, including at least one resistive layer (10), reflux layer (11) and insulating layer(7,12,21, (20, (21 necessary places. According to the present invention, measuringresistance has particularly good frequency response, long-time stability are good, it isefficiently cooling, and it may be implemented cheap to produce, thus a part of theresistive layer (10) and return current layer (11) and required insulating layer
(7,12,21,22,24) and including a large amount of interconnected multilayer circuit board(14), their resistive layers (10) from base area are outside. Return current layer (11)preferably has resistive layer (10) of conductor path (15) geometrical arrangementshaving the same as conductor path.
申请人:LEM NORMA GMBH
地址:Liebermannstrasse F01 2345 Brunn am Gebirge AT
国籍:AT
代理机构:Heger, Georg, Dipl.-Ing., Dr.
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